S. Boakye-Yiadom, N. Bassim, (2013) Use of Focused Ion Beam (FIB) to study the impact properties of materials. Proceedings of the 6th Focused Ion Beam-Scanning Electron Microscopy Conference, Cambridge, MA-USA: 2-3.
S. Boakye-Yiadom, N. Bassim, (2013) Use of Focused Ion Beam (FIB) to study the impact properties of materials. Proceedings of the 6th Focused Ion Beam-Scanning Electron Microscopy Conference, Cambridge, MA-USA: 2-3.