S. Boakye-Yiadom, N. Bassim, (2013) Use of Focused Ion Beam (FIB) to study the impact properties of materials. Proceedings of the 6th Focused Ion Beam-Scanning Electron Microscopy Conference, Cambridge, MA-USA: 2-3.
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S. Boakye-Yiadom, N. Bassim, (2013) Use of Focused Ion Beam (FIB) to study the impact properties of materials. Proceedings of the 6th Focused Ion Beam-Scanning Electron Microscopy Conference, Cambridge, MA-USA: 2-3.